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General Information
    • ISSN: 1793-8236 (Online)
    • Abbreviated Title Int. J. Eng. Technol.
    • Frequency:  Quarterly 
    • DOI: 10.7763/IJET
    • APC: 500 USD
    • Managing Editor: Ms. Shira. Lu 
    • Abstracting/ Indexing: Inspec (IET), CNKI Google Scholar, EBSCO, ProQuest, Crossref, Ulrich Periodicals Directory, Chemical Abstracts Services (CAS), etc.
    • E-mail: ijet_Editor@126.com
IJET 2012 Vol.4(3): 288-293 ISSN: 1793-8236
DOI: 10.7763/IJET.2012.V4.367

Integrated Key Based Strict Friendly Verification of Neighbors in MANET

Dhadesugoor R. Vaman and Niraj Shakhakarmi

Abstract—A novel Strict Friendliness Verification (SFV) scheme based on the integrated key consisting of symmetric node identity, geographic location and round trip response time between the sender and the receiver radio in MANET is proposed. This key is dynamically updated for encryption and decryption of each packet to resolve Wormhole attack and Sybil attack. Additionally, it meets the minimal key lengths required for symmetric ciphers to provide adequate commercial security. Furthermore, the foe or unfriendly node detection is found significantly increasing with the lower number of symmetric Ds. This paper presents the simulation demonstrating the performance of SFV in terms of dynamic range usingdirectional antenna on radios (or nodes), and the performance in terms of aggregate throughput, average end to end delay and packet delivered ratio.

Index Terms—Integrated key; strict friendliness verification; mobile ad hoc networks; wormhole attack; Sybil attack; foe detection rate.

N. Shakhakarmi was with the ARO Center for Battlefield Communications, Prairie View AandM University, Houston, USA (e-mail:niraj7sk@ yahoo.com).
D. R. Vaman. is with the ARO Center for Battlefield Communications, Prairie View AandM University, Houston, USA (e-mail: drvaman@pvamu. edu).

[PDF]

Cite: Dhadesugoor R. Vaman and Niraj Shakhakarmi, "Integrated Key Based Strict Friendly Verification of Neighbors in MANET," International Journal of Engineering and Technology vol. 4, no. 3, pp. 288-293, 2012.

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