Abstract—Both environmental and genetic factors have roles in the development of any disease. The quest for an understanding of how genetic factors contribute to human disease is gathering speed. Differential gene expression analysis plays an important role for the study of genetic factors causing diseases. We proposed a method for identifying differentially expressed genes causing Type-2 diabetes mellitus using microarray data for diabetes with parental history and healthy. This method focuses on identifying multivariate and univariate outliers using Mahalanobis Distance, Minimum Co-variance Determinant (MCD) and other statistical methods. For the identified inflammatory genes we performed the functional classification by using Gene Ontology and identified the pathways between these inflammatory genes using pathway analysis. This method is applied on microarray data from two samples one from diabetes with parental history and the other from healthy and identified 1579 genes which are differentially expressed and functional classification was preformed to these genes. Prior to analysis, the microarray data is normalized using Lowess Normalization method.
Index Terms—Inflammatory genes, Gene ontology, Pathway analysis, Outliers, Mahalanobis distance, Type-2 diabetes mellitus
F. A. Author is with the Department of CSE, S R K R Engineering College, Bhimavaram, India (email: chandu.vasamsetty@gmail.com).S. B. Author is with the Professor in CS&SE, AU College ofEngg.,,Visakhapatnam-530003,AndhraPradesh,India.
T. C. Author is with the Vice Chancellor, JNT University Kakinada, AP, India.
F. D. Author is with the 4Professor, Department of CSE, VR Siddartha College of Engg., Vijayawada, AP, India.
F. E. Author is with the Department of CSE, S R K R Engineering College, Bhimavaram, India (email: chinta.someswararao@gmail.com).
Cite: Chandra Sekhar Vasamsetty, Srinivasa Rao Peri, Allam Appa Rao, K. Srinivas, and Chinta Someswararao, "Gene Expression Analysis for Type-2 Diabetes Mellitus–A Case Study on Healthy vs Diabetes with Parental History," International Journal of Engineering and Technology vol. 3, no. 3, pp. 310-314, 2011.
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